Anritsu 3680K Universal Test Fixture
The Anritsu 3680K Universal Test Fixture offers a highly accurate and repeatable solution designed specifically for measuring microstrip and coplanar substrate devices. Ideal for professionals in the fields of telecommunications, RF engineering, and electronics, the 3680K delivers precision and performance for advanced testing applications.
Key Features and Specifications:
- Frequency Range: Covers a wide frequency from DC to 40 GHz, ensuring versatility for a broad range of applications.
- Measurement Capabilities: Designed for both microstrip and coplanar measurement, providing flexibility for different testing needs.
- Device Compatibility: Accommodates offset and right-angle test devices, maximizing usability.
- Calibration/Verification Kits: Optional calibration and verification kits available for enhanced accuracy.
- Substrate Measurement: Offers precise substrate measurement capability to meet detailed testing requirements.
- Bias Capability: Designed with bias capability to streamline measurement processes.
- MMIC Measurements: Optional support for MMIC measurements, catering to specialized testing demands.
- Supported Substrate Types: Compatible with microstrip or coplanar waveguide substrates, offering versatility.
- Overall Dimensions: Compact design with dimensions of 10 x 12.7 x 6.4 cm, suitable for various lab environments.
- Substrate Length: Supports substrate lengths ranging from a minimum of 0.5 cm to a maximum of 5 cm, with extended support up to 10 cm using the 3680-20 option.
- Maximum Substrate Width: No limit on maximum substrate width, providing flexibility in testing larger devices.
- Substrate Thickness: Accommodates substrates with a thickness of 0.012 cm minimum to 0.19 cm maximum, ideal for different applications.
- Maximum Line Offset: Supports line offsets of ±1.2 cm, extended to ±2.5 cm with the 3680-20, ensuring adaptability to various setups.
