ANRITSU 3680V Universal Test Fixture
The Anritsu 3680V Universal Test Fixture is engineered to deliver precise and consistent measurement solutions for microstrip and coplanar substrate devices. This advanced test fixture is a vital tool for professionals seeking reliability and accuracy in their testing processes.
Key Features and Specifications:
- Frequency Coverage: DC to 60 GHz, allowing for a wide range of applications.
- Measurement Capabilities: Supports both microstrip and coplanar measurements, making it versatile for various device types.
- Device Accommodation: Designed to accommodate offset and right-angle test devices, facilitating diverse testing scenarios.
- Calibration/Verification: Optional calibration and verification kits available, enhancing measurement accuracy.
- Substrate Measurement: Capable of measuring different substrate types efficiently according to testing needs.
- Bias Capability: Integrates bias capability for enhanced testing options.
- MMIC Measurements: Optional feature to support the measurement of Monolithic Microwave Integrated Circuits (MMIC).
- Substrate Types Supported: Compatible with microstrip or coplanar waveguide substrates, expanding application scope.
- Overall Size: Compact dimensions of 10 x 12.7 x 6.4 cm, allowing for easy integration into various testing environments.
- Substrate Length Range: Accommodates substrates ranging from 0.5 cm to 5 cm in length, extendable to 10 cm with the 3680-20.
- Maximum Substrate Width: No limitations, permitting the use of larger substrates as needed.
- Substrate Thickness Range: Supports thicknesses from 0.012 cm minimum to 0.19 cm maximum, catering to various substrate specifications.
- Maximum Line Offset: Features a maximum line offset of ±1.2 cm, expandable to ±2.5 cm with the 3680-20.
The Anritsu 3680V is crafted for professionals demanding high performance in microstrip and coplanar device testing, ensuring accurate results and ease of use in a compact design.
